红外全反射附件
OPRex-ATR
无需制样 · 表面灵敏 · 快速测试
产品介绍
利用衰减全反射（ATR）原理，可以对液体、粉末、聚合物、薄膜等样品进行快速、无损的红外光谱分析，且几乎无需样品制备。红外光在与样品接触的ATR晶体界面发生全反射，产生的"倏逝波"渗入样品表层约数微米深度，通过检测因样品吸收而衰减的反射光获得高质量的表面红外光谱。适配各品牌傅里叶变换红外光谱仪，可独立使用，也可与电化学原位池联用。
产品优点
- 无需样品制备：液体直接滴加、粉末直接压贴，省去压片等繁琐制样步骤
- 样品适用范围广：液体、固体粉末、聚合物薄膜、涂层等均可直接测量
- 表面灵敏：倏逝波穿透深度仅数微米，特别适合表面和薄层分析
产品参数
| 入射角度 | 60° |
| ATR晶体 | 硅、锗、氟化钙等（可按需选择） |
| 光谱范围 | 取决于晶体材质和配套光谱仪 |
| 产品尺寸 | L100mm×W60mm×H40mm |
Infrared Attenuated Total Reflectance Accessory
OPRex-ATR
PRODUCT INTRO
Built on attenuated total reflectance (ATR) principles, the OPRex-ATR enables fast, non-destructive IR analysis of liquids, powders, polymers, films and other samples with essentially no sample preparation. Total internal reflection at the ATR crystal/sample interface generates an evanescent wave that penetrates several micrometres into the surface layer; detecting the reflected beam attenuated by sample absorption yields high-quality surface IR spectra. The accessory is compatible with all major FTIR spectrometers and can be used stand-alone or coupled with electrochemical in-situ cells.
PRODUCT ADVANTAGES
- No sample preparation: liquids are dropped directly, powders pressed against the crystal — no tedious pelletizing
- Broad sample compatibility: liquids, solid powders, polymer films and coatings can all be measured directly
- Surface sensitive: the evanescent wave penetrates only a few micrometres, making it ideal for surface and thin-layer analysis
PRODUCT SPECIFICATIONS
| Parameter | Specification |
| Incidence Angle | 60° |
| ATR Crystal | Silicon, Germanium, Calcium Fluoride, etc. (selectable on demand) |
| Spectral Range | Depends on crystal material and host spectrometer |
| Dimensions | L100 mm × W60 mm × H40 mm |